{"id":77,"date":"2021-04-27T08:35:50","date_gmt":"2021-04-27T08:35:50","guid":{"rendered":"https:\/\/indico.inoe.ro\/?page_id=77"},"modified":"2026-03-16T21:27:16","modified_gmt":"2026-03-16T21:27:16","slug":"services","status":"publish","type":"page","link":"https:\/\/indico.inoe.ro\/index.php\/services\/","title":{"rendered":"Services"},"content":{"rendered":"\n

SERVICES<\/strong> of characterization and diagnosis <\/p>\n\n\n\n

Laser energy\/power<\/a><\/p>\n\n\n\n

Laser beam profile<\/a><\/p>\n\n\n\n

Laser pulse width<\/a><\/p>\n\n\n\n

FT optical spectrum analysis<\/a><\/p>\n\n\n\n

Polarization state analysis<\/a><\/p>\n\n\n\n

Characterization of optical components<\/a> (focal length, angles of prisms, surface flatness, dimensional measurements )<\/p>\n\n\n\n

Spectral analysis of materials<\/a> (filters transmission, thin films characterization)<\/p>\n\n\n\n

<\/p>\n\n\n\n

LIST OF INSTRUMENTS<\/strong><\/p>\n\n\n\n

Crt. No.<\/strong><\/td>Item<\/strong><\/td>Manufacturer<\/strong><\/td>Model<\/strong><\/td>Status<\/strong><\/td><\/tr>
1<\/td>Video measurement microscope<\/td>Hoffmann<\/td>MM1-300\/6X GARANT<\/td>New<\/strong><\/td><\/tr>
2<\/td>Laser Beam profiler<\/td>Ophir Photonics<\/td>NanoScan2<\/td>New<\/strong><\/td><\/tr>
3<\/td>Electronic autocolimator<\/td>Moeller-Wedel Optical<\/td>Elcomat vario D 500T\/65<\/td>New<\/strong><\/td><\/tr>
4<\/td>Interferometer and accessories<\/td>Moeller-Wedel Optical<\/td>Interferometer VI-direct 100 SL<\/td>New<\/strong><\/td><\/tr>
5<\/td>Diopter telescope<\/td>Moeller-Wedel Optical<\/td>Diopter telescope \u00b15.0 dpt, 0.1 dpt div.<\/td>New<\/strong><\/td><\/tr>
6<\/td>Dynameter<\/td>Moeller-Wedel Optical<\/td>Dynameter<\/td>New<\/strong><\/td><\/tr>
7<\/td>Laser He-Ne CW 633nm<\/td>ThorLabs<\/td>Laser and accessories<\/td>New<\/strong><\/td><\/tr>
8<\/td>Laser diodes CW   405, 532, 635, 859 and 1064 nm<\/td>ThorLabs<\/td>Laser and accessories<\/td>New<\/strong><\/td><\/tr>
9<\/td>Laser UV 355nm CW<\/td>Roithner<\/td>Laser and accessories<\/td>New<\/strong><\/td><\/tr>
10<\/td>Optical Spectrum Analyzer<\/td>ThorLabs<\/td>OSA 201, OSA 202<\/td>New<\/strong><\/td><\/tr>
11<\/td>Polarization analyzing system<\/td>ThorLabs<\/td>PAX57VIS-T, PAN5710IR2<\/td>New<\/strong><\/td><\/tr>
12<\/td>Ultrafast photodiode<\/td>Alphalas<\/td>UPD-200-UP<\/td>New<\/strong><\/td><\/tr>
13<\/td>Oscilloscope<\/td>Tektronix<\/td>DPO7254<\/td>Exist.<\/td><\/tr>
14<\/td>Spectrophotometer<\/td>PerkinElmer<\/td>LAMBDA 1050 UV\/Vis\/NIR<\/td>Exist.<\/td><\/tr>
15<\/td>Ellipsometer<\/td>HORIBA<\/td>UVISEL ER AGAS<\/td>Exist.<\/td><\/tr>
16<\/td>Energy\/Powermeter<\/td>Gentec<\/td>SOLO PE<\/td>Exist.<\/td><\/tr>
17<\/td>Goniometer<\/td>Moeller-Wedel Optical<\/td>Goniometer II-VIS<\/td>Exist.<\/td><\/tr>
18<\/td>Focal length meas. device<\/td>Moeller-Wedel Optical<\/td>MELOS 530-3<\/td>Exist.<\/td><\/tr><\/tbody><\/table><\/figure>\n\n\n\n

LASER ENERGY\/POWER <\/strong><\/p>\n\n\n\n

One of the most important characteristic of a laser source is its energy (for a pulsed laser) or its power (for a CW laser). Measurements can be done at high acquisition rates allowing thus an accurate determination of pulse-to-pulse energy fluctuation. All measured data are stored and processed to get statistics (average, standard deviation, RMS, maximum, minimum, peak-to-peak). Report contains also measurement uncertainty data.<\/p>\n\n\n\n

Laser energy<\/strong> can be measured using a Gentec SOLO-PE Energy\/Powermeter together with the next measuring heads (QE 50 SP-MB and XLE4):<\/p>\n\n\n\n

Measuring head<\/td>QE 50 SP-MB<\/strong><\/td>XLE4<\/strong><\/td><\/tr>
Measured energy range<\/td>15 \u00b5J \u2013 75 J<\/td>100 nJ \u2013 4 mJ<\/td><\/tr>
Wavelength range<\/td>190 nm \u2013 20 \u00b5m<\/td>190 nm \u2013 2.5 \u00b5m<\/td><\/tr>
Sensor area<\/td>50 x 50 mm<\/td>\u00d8 4 mm<\/td><\/tr>
Rise time<\/td> <\/td>10 \u00b5s<\/td><\/tr>
Max. pulse width<\/td>225 \u00b5s<\/td>5 \u00b5s<\/td><\/tr><\/tbody><\/table><\/figure>\n\n\n\n

Laser power<\/strong> can be measured using a Gentec SOLO-PE Energy\/Powermeter together with the next measuring heads (PH100-Si, PH20-Ge, UP12E, UP25N and UP55N):<\/p>\n\n\n\n

Measuring head<\/td>PH100-Si<\/strong><\/td>PH20-Ge<\/strong><\/td>UP12E<\/strong><\/td>UP25N<\/strong><\/td>UP55N<\/strong><\/td><\/tr>
Measured power range<\/td>600 pW – 30 mW<\/td>2 nW – 30 mW<\/td>1 mW \u2013 70 W<\/td>3 mW – 300 W<\/td>5 mW – 400 W<\/td><\/tr>
Wavelength range<\/td>300 nm – 1100 nm<\/td>800 nm – 1650 nm<\/td>190 nm – 11 \u00b5m<\/td>190 nm – 11 \u00b5m<\/td>190 nm – 11 \u00b5m<\/td><\/tr>
Sensor area<\/td>\u00d8 11.28 mm<\/td>\u00d8 5 mm<\/td>\u00d8 12 mm<\/td>\u00d8 25 mm<\/td>\u00d8 55 mm<\/td><\/tr><\/tbody><\/table><\/figure>\n\n\n\n
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LASER BEAM PROFILE<\/strong><\/p>\n\n\n\n

A more precise diagnostic of a laser source requires an analysis of the laser beam profile. A laser beam profiler provides important information characterizing the laser, as the energy (pulsed lasers) or power (CW lasers) distribution in a cross section of the laser beam, the waist of the beam, its divergence and M2<\/sup> factor (that quantifies the beam quality of laser beams).<\/p>\n\n\n\n

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These measurements can be done using one of the next three heads (NS2-Si\/9\/5-PRO, NS2-Ge\/9\/5-PRO and NS2-Pyro\/9\/5-PRO), depending on the required wavelength:<\/p>\n\n\n\n